The Impact of Bias Row Noise to Photometric Accuracy: Case Study Based on a Scientific CMOS Detector

Title The Impact of Bias Row Noise to Photometric Accuracy: Case Study Based on a Scientific CMOS Detector
Publication Type Journal Article
Authors Shao, L, Zhan, H, Liu, C, Chi, H, Luo, Q, Mu, H, Shi, W
DOI http://dx.doi.org/10.1088/1674-4527/ad1793
English